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Titre du document / Document title

High resolution, direct detection X-ray imagers

Auteur(s) / Author(s)

STREET Robert A. (1) ; READY Steve E. (1) ; RAHN Jeffrey T. (1) ; MULATO Marcelo (1) ; SHAH Kanai (2) ; BENNETT Paul R. (2) ; PING MEI (1) ; LU Jeng-Ping (1) ; APTE Raj B. (1) ; HO Jackson (1) ; VAN SCHUYLENBERGH Koenraad (1) ; LEMMI Francesco (1) ; BOYCE James B. (1) ; NYLEN Per (3) ; SCHIEBER Michael (4) ; HERMON Haim (4) ;

Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)

(1) Xerox Palo Alto Research Center, Palo Alto, CA 94304, ETATS-UNIS
(2) RMD, Watertown, MA 02172, ETATS-UNIS
(3) Dept. of Physics University of Stockholm, SUEDE
(4) Hebrew University of Jerusalem, Jerusalem 91904, ISRAEL

Résumé / Abstract

We report on a-Si direct detection x-ray image sensors with polycrystalline PbI2, and more recently with HgI2. The arrays have 100 micron, pixel size and, we study those aspects of the detectors that mainly determine the DQE, such as sensitivity, effective fill factor, dark current noise, noise power spectrum, and x-ray absorption. Line spread function data show that in the PbI2 arrays, most of the signal in the gap between pixels is collected, which is important for high DQE. The leakage current noise agrees with the expected shot noise value with only a small enhancement at high bias voltages. The noise power spectrum under x-ray exposure is reported and compared to the spatial resolution information. The MTF is close to the ideal sinc function, but is reduced by the contribution of K-fluorescence in the PbI2 film for which we provide new experimental evidence. The role of noise power aliasing in the DQE and the effect of slight image spreading are discussed. Initial studies of HgI2 as the photoconductor material show very promising results with high x-ray sensitivity and low leakage current.

Revue / Journal Title

SPIE proceedings series  

Source / Source

Congrès
Physics of medical imaging :   ( San Diego CA, 13-15 February 2000 )
Physics of medical imaging. Conference, San Diego CA , ETATS-UNIS (13/02/2000)
2000  , vol. 3977, pp. 418-428[Note(s) : XIV, 704 p., ] (15 ref.) ISBN 0-8194-3594-5 ;  Illustration : Illustration ;

Langue / Language

Anglais

Editeur / Publisher

Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, INTERNATIONAL  (1988) (Revue)
SPIE, Bellingham WA, ETATS-UNIS  (2000) (Monographie)

Mots-clés anglais / English Keywords

Radiography ; Human ; X ray ; Particle detector ; Silicon ; Lead ; Iodine ; Polycrystal ; Mercury ; Performance evaluation ; Spatial resolution ; Absorptance ; Signal to noise ratio ; Photoconductor materials ; Sensitivity ; Leakage current ; Radiodiagnosis ; Medical imagery ;

Mots-clés français / French Keywords

Radiographie ; Homme ; Rayon X ; Détecteur particule ; Silicium ; Plomb ; Iode ; Polycristal ; Mercure ; Evaluation performance ; Résolution spatiale ; Coefficient absorption ; Rapport signal bruit ; Photoconducteur ; Sensibilité ; Courant fuite ; Radiodiagnostic ; Imagerie médicale ;

Mots-clés espagnols / Spanish Keywords

Radiografía ; Hombre ; Rayos X ; Detector partícula ; Silicio ; Plomo ; Iodo ; Policristal ; Mercurio ; Evaluación prestación ; Resolución espacial ; Coeficiente absorción ; Relación señal ruido ; Fotoconductor ; Sensibilidad ; Corriente escape ; Radiodiagnóstico ; Imageneria medical ;

Localisation / Location

INIST-CNRS, Cote INIST : 21760, 35400009200651.0430

Nº notice refdoc (ud4) : 781148



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