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Titre du document / Document title

Measurement of spectral characteristics of semiconductor laser diodes. Effect of injected current modulation and optical feedback

Auteur(s) / Author(s)

DESTREZ A. (1) ; TOFFANO Z. (1) ; JOINDOT I. (2) ; BIROCHEAU C. (1) ; HASSINE L. (1) ;

Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)

(1) Serv. radioélectricité électronique SUPELEC, lab. optoélectronique, 91192 Gif-sur-Yvette, FRANCE
(2) Cent. national études telécommunications LAB/OCM/TOH, 22301 Lannion, FRANCE

Résumé / Abstract

We present precision optical spectral lineshape measurements on semiconductor lasers using Michelson and Fabry-Perot interferometers. Measurements ranging from 30 MHz up to 100 GHz give the spectral behavior above and below threshold even for very small emitted optical powers. Variations of the linewidth above and below threshold as a function of injected current have been measured and used to evaluate the linewidth enhancement factor and behavior at threshold. The lineshape can differ from the modified Schawlow-Townes almost Lorentzian form for semiconductor lasers above threshold when submitted to operating system conditions such as modulation and optical feedback. Under modulation, line frequency and signal form are modified because of chirping effects

Revue / Journal Title

IEEE transactions on instrumentation and measurement    ISSN  0018-9456   CODEN IEIMAO 

Source / Source

Congrès
CPEM '92: 1992 conference on precision electromagnetic measurements, Paris , FRANCE (09/06/1992)
1993, vol. 42, no 2 (11 ref.), pp. 304-310

Langue / Language

Anglais

Editeur / Publisher

Institute of Electrical and Electronics Engineers, New York, NY, ETATS-UNIS  (1963) (Revue)

Mots-clés anglais / English Keywords

Laser diodes

;

Semiconductor lasers

;

Feedback

;

Optics

;

Injection

;

Electric currents

;

Spectra

;

Measuring instruments

;

Mots-clés français / French Keywords

Diode laser

;

Laser semiconducteur

;

Boucle réaction

;

Optique

;

Injection

;

Courant électrique

;

Spectre

;

Appareil mesure

;

Localisation / Location

INIST-CNRS, Cote INIST : 222 G1, 35400003528073.0430

Nº notice refdoc (ud4) : 3824881



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