Titre du document / Document title
Studies of defect behavior in large-grain, polycrystalline ice using synchrotron X-ray topography
Auteur(s) / Author(s)
DUDLEY M. (1) ;
FUPING LIU ;
BAKER I. ;
Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)
(1) SUNY Stony Brook, dep. materials sci. eng., Stony Brook NY 11794-2275, ETATS-UNIS
Résumé / Abstract
Synchrotron White Beam X-ray Topography (SWBXT) has been used to conduct in situ, low temperature studies of the behavior of defects introduced into large-grain, polycrystalline ice of very low «as-grown» defect density. The generation of faulted and unfaulted interstitial dislocation loops as a function of imposed temperature changes was observed. Variations in the distribution of these loops in the vicinity of grain boundaries are discussed in the context of diffusion mobilities on the basal plane and the relative orientation between the basal plane and the grain boundary plane. Dislocation generation mechanisms under applied compressive stresses were also investigated in situ using a specially-designed compression stage
Revue / Journal Title
Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals
ISSN
1058-725X
Source / Source
Congrès
International conference on the chemistry of the organic solid state N
o11, Ramat Rachel
, ISRAEL
(04/07/1993)
1994, vol. 240 (16 ref.), pp. 73-80
Langue / Language
Anglais
Editeur / Publisher
Gordon and Breach, Philadelphia, PA, ETATS-UNIS
(1992-2002)
(Revue)
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Localisation / Location
INIST-CNRS, Cote INIST : 12857, 35400004188158.0080
Nº notice refdoc (ud4) : 3311531