Titre du document / Document title
Variable-force microscopy for advanced characterization of horizontally aligned carbon nanotubes
Auteur(s) / Author(s)ALMAQWASHI Ali A.
KEVEK Joshua W.
BURTON Rachel M.
MINOT Ethan D.
Résumé / Abstract
Atomic force microscopy (AFM) performed with variable-force imaging was recently demonstrated to be an accurate method of determining the diameter and number of sidewalls of a carbon nanotube (CNT). This AFM technique provides an alternative to transmission electron microscopy (TEM) when TEM imaging is not possible due to substrate thickness. We have used variable-force AFM to characterize horizontally aligned CNTs grown on ST-cut quartz. Our measurements reveal new aspects of horizontally aligned growth that are essential for enhancing the performance of CNT-based devices as well as understanding the growth mechanism. First, previously reported optimal growth conditions produce a large spread in CNT diameters and a significant fraction of double-walled CNTs. Second, monodispersity is significantly improved when growth temperature is reduced. Third, CNTs with diameters up to 5 nm align to the substrate, suggesting the interaction between CNTs and the quartz lattice is more robust than previously reported.
Revue / Journal TitleNanotechnology
Source / Source
2011, vol. 22, no
27, [Note(s): 275717.1-275717.5]
Langue / Language
Editeur / Publisher
Institute of Physics, Bristol, ROYAUME-UNI
Localisation / Location
INIST-CNRS, Cote INIST : 22480, 35400018993346.0550
Nº notice refdoc (ud4) : 24319424