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Titre du document / Document title

An Efficient Finite-Element Approach for the Modeling of Planar Double-D Excitation Coils and Flaws in SQUID NDE Systems

Auteur(s) / Author(s)

SARRESHTEDARI Farrokh (1) ; POURHASHEMI Arash (1) ; ASAD Narjes (2) ; SCHUBERT Juergen (3) ; BANZET Marko (3) ; FARDMANESH Mehdi (1) ;

Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)

(1) Department of Electrical Engineering, Sharif University of Technology, Tehran 11365- 9363, IRAN, REPUBLIQUE ISLAMIQUE D'
(2) Department Physics, University of Tehran, Tehran 14399, IRAN, REPUBLIQUE ISLAMIQUE D'
(3) Institute of Bio and Nanosystems, Forschungszentrum Jülich, 52425 Jülich, ALLEMAGNE

Résumé / Abstract

Incorporating an efficient approach for the finite-element simulation of eddy current superconductive quantum interface device (SQUID) nondestructive evaluation (NDE) systems, an appropriate finite-element method (FEM) has been presented for simulating and analyzing such systems. We have introduced a new model for the planar double-D coils, which are used as the excitation source in eddy current SQUID NDE systems, and also another model for the description of the flaw effect on the induced current. We have also examined our simulation results with their associated measurements. Our system is based on a high-Tc YBCO gradiometer RF-SQUID sensor with a flux noise level below 100 μΦ0/√Hz at 100 Hz in an unshielded environment while being shielded against external RF electromagnetic interference. The very good agreement between experimental and numerical approaches confirmed our model for the 3-D FEM simulation of the system, which is being done in reasonable time and using reasonable computer resources.

Revue / Journal Title

IEEE transactions on applied superconductivity    ISSN  1051-8223 

Source / Source

2010, vol. 20, no2, pp. 76-81 [6 page(s) (article)] (14 ref.)

Langue / Language

Anglais

Editeur / Publisher

Institute of Electrical and Electronics Engineers, New York, NY, ETATS-UNIS  (1991) (Revue)

Mots-clés anglais / English Keywords

Electromagnetic disturbance

;

High temperature superconductor

;

Electromagnetic interference

;

Electromagnetic compatibility

;

Noise level

;

SQUID magnetometers

;

Induced current

;

Excitation source

;

Quantum electronics

;

Superconductor device

;

Eddy current

;

System simulation

;

Non destructive test

;

Superconducting quantum interferometer device

;

Planar technology

;

Modeling

;

Numerical method

;

Finite element method

;

Mots-clés français / French Keywords

Perturbation électromagnétique

;

Supraconducteur haute température

;

Brouillage

;

Compatibilité électromagnétique

;

Niveau bruit

;

Magnétomètre SQUID

;

Courant induit

;

Source excitation

;

Electronique quantique

;

Dispositif supraconducteur

;

Courant Foucault

;

Simulation système

;

Essai non destructif

;

Dispositif supraconducteur quantique

;

Technologie planaire

;

Modélisation

;

Méthode numérique

;

Méthode élément fini

;

Mots-clés espagnols / Spanish Keywords

Perturbación electromagnética

;

Supraconductor alta temperatura

;

Interferencia

;

Compatibilidad electromagnética

;

Nivel ruido

;

Corriente inducida

;

Fuente excitación

;

Dispositivo supraconductor

;

Corriente Foucault

;

Simulación sistema

;

Ensayo no destructivo

;

Dispositivo supraconductor cuántico

;

Tecnología planar

;

Modelización

;

Método numérico

;

Método elemento finito

;

Mots-clés d'auteur / Author Keywords

Double-D modeling

;

finite element

;

flaw modeling

;

RF superconductive quantum interface device (SQUID) gradiometer

;

SQUID nondestructive evaluation (NDE)

;

Localisation / Location

INIST-CNRS, Cote INIST : 22424, 35400018155599.0050

Nº notice refdoc (ud4) : 22582362



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