Titre du document / Document title
An Efficient Finite-Element Approach for the Modeling of Planar Double-D Excitation Coils and Flaws in SQUID NDE Systems
Auteur(s) / Author(s)
SARRESHTEDARI Farrokh (1) ;
POURHASHEMI Arash (1) ;
ASAD Narjes (2) ;
SCHUBERT Juergen (3) ;
BANZET Marko (3) ;
FARDMANESH Mehdi (1) ;
Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)
(1) Department of Electrical Engineering, Sharif University of Technology, Tehran 11365- 9363, IRAN, REPUBLIQUE ISLAMIQUE D'
(2) Department Physics, University of Tehran, Tehran 14399, IRAN, REPUBLIQUE ISLAMIQUE D'
(3) Institute of Bio and Nanosystems, Forschungszentrum Jülich, 52425 Jülich, ALLEMAGNE
Résumé / Abstract
Incorporating an efficient approach for the finite-element simulation of eddy current superconductive quantum interface device (SQUID) nondestructive evaluation (NDE) systems, an appropriate finite-element method (FEM) has been presented for simulating and analyzing such systems. We have introduced a new model for the planar double-D coils, which are used as the excitation source in eddy current SQUID NDE systems, and also another model for the description of the flaw effect on the induced current. We have also examined our simulation results with their associated measurements. Our system is based on a high-T
c YBCO gradiometer RF-SQUID sensor with a flux noise level below 100 μΦ
0/√Hz at 100 Hz in an unshielded environment while being shielded against external RF electromagnetic interference. The very good agreement between experimental and numerical approaches confirmed our model for the 3-D FEM simulation of the system, which is being done in reasonable time and using reasonable computer resources.
Revue / Journal Title
IEEE transactions on applied superconductivity
ISSN
1051-8223
Source / Source
2010, vol. 20, n
o2, pp. 76-81 [6 page(s) (article)] (14 ref.)
Langue / Language
Anglais
Editeur / Publisher
Institute of Electrical and Electronics Engineers, New York, NY, ETATS-UNIS
(1991)
(Revue)
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Localisation / Location
INIST-CNRS, Cote INIST : 22424, 35400018155599.0050
Nº notice refdoc (ud4) : 22582362
