Titre du document / Document title
Shape memory behavior of high temperature Ti-Ni-Pt thin films
Auteur(s) / Author(s)
PANDURANGA Mohanchandra K.
(1) ;
SHIN Daniel D.
(1) ;
CARMAN Gregory P.
(1) ;
Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)
(1) Mechanical and Aerospace Engineering Department, University of California at Los Angeles, Los Angeles, California 90095-1597, ETATS-UNIS
Résumé / Abstract
Titanium-nickel-platinum (Ti
54Ni
26Pt
20) thin films shape memory alloys are produced using direct current magnetron sputtering process. The films are deposited on a (100) silicon substrate with 500 nm of wet thermal oxide layer. As-deposited amorphous films are crystallized at 550 °C and 600 °C for 1 h. X-ray diffraction shows that the structure of the martensitic phase is orthorhombic (B19). Both films exhibit classic shape memory effect. The transformation temperatures for the films are above 300 °C, the film annealed at 600 °C has higher transformation temperatures which are attributed to the presence of large precipitates not found in the film annealed at 550 °C.
Revue / Journal Title
Thin solid films
ISSN 0040-6090
CODEN THSFAP
Source / Source
2006, vol. 515, n
o4, pp. 1938-1941 [4 page(s) (article)] (15 ref.)
Langue / Language
Anglais
Editeur / Publisher
Elsevier, Lausanne, SUISSE
(1967)
(Revue)
Mots-clés anglais / English Keywords
Amorphous thin film ;
Shape memory alloy ;
Platinum ;
Nickel ;
Titanium ;
Transmission electron microscopy ;
Precipitates ;
Orthorhombic lattices ;
XRD ;
Oxide layer ;
Cathode sputtering ;
Martensitic transformations ;
Thin films ;
Memory ;
Mots-clés français / French Keywords
Couche mince amorphe ;
6110N ;
6150K ;
Substrat Si ;
Pt ;
Ni ;
Ti ;
Alliage mémoire forme ;
Platine ;
Nickel ;
Titane ;
Microscopie électronique transmission ;
Précipité ;
Réseau orthorhombique ;
Diffraction RX ;
Couche oxyde ;
Pulvérisation cathodique ;
Transformation martensitique ;
Couche mince ;
Mémoire ;
Mots-clés espagnols / Spanish Keywords
Aleación memoria forma ;
Capa óxido ;
Memoria ;
Mots-clés d'auteur / Author Keywords
Shape memory ;
Titanim nickel platinum films ;
Sputtering ;
Transmission electron microscopy ;
X-ray diffraction ;
Localisation / Location
INIST-CNRS, Cote INIST : 13597, 35400015957898.1140
Nº notice refdoc (ud4) : 18440014