Titre du document / Document title

Microparticle adhesion studies by atomic force microscopy

Auteur(s) / Author(s)

SEGEREN L. H. G. J. ^{(1 2)} ; SIEBUM B. ⁽¹⁾ ; KARSSENBERG F. G. ⁽²⁾ ; VAN DEN BERG J. W. A. ⁽¹⁾ ; VANCSO G. J. ^{(1 2)} ;

Affiliation(s) du ou des auteurs / Author(s) Affiliation(s)

⁽¹⁾ Department of Materials Science and Technology of Polymers and MESA+ Research Institute, University of Twente, P.O. Box 217, 7500 AE Enschede, PAYS-BAS
⁽²⁾ Dutch Polvmer Institute, P.O. Box 902, 5600 AX Eindhoven, PAYS-BAS

Résumé / Abstract

Atomic force microscopy (AFM) is one of the most flexible and simple techniques for probing surface interactions. This article reviews AFM studies on particle adhesion Special attention is paid to the characterization of roughness and its effect on adhesion This is of importance when comparing the measured adhesion forces to theoretical values, as the contact area is included in the contact mechanics theories. Even though adhesion models for time-independent adhesion are reasonably well developed, it remains difficult to connect the measured values to model predictions, especially because of the unknown value of the true contact area. The true area of contact depends on both the roughness of the probe as well as of the substrate. Our studies on the interactions between smooth silica particles, or rougher toner particles, and silicon substrates as a function of the surface roughness of the latter has shown the utility of AFM for measuring both roughness and particle adhesion.

Revue / Journal Title

Journal of adhesion science and technology   ISSN 0169-4243   CODEN JATEE8 

Source / Source

2002, vol. 16, n^o 7 (249 p.)  (121 ref.), pp. 793-828

Langue / Language

Anglais

Editeur / Publisher

Brill, Leiden, PAYS-BAS  (1987) (Revue)

Mots-clés anglais / English Keywords

Experimental study ; Theoretical study ; Roughness ; Force microscopy ; Microparticles ; Adhesion ; Surface phenomena ; Atomic force microscopy ; Reviews ;

Mots-clés français / French Keywords

Etude expérimentale ; Etude théorique ; Rugosité ; Microscopie force ; Microparticule ; Adhérence ; Phénomène surface ; Microscopie force atomique ; Article synthèse ;

Mots-clés espagnols / Spanish Keywords

Microscopía fuerza ;

Localisation / Location

INIST-CNRS, Cote INIST : 21725, 35400010174002.0020